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Atomic force microscope 43-ATM100

ATOMIC FORCE MICROSCOPE
43-ATM100

ATOMIC FORCE MICROSCOPE 43-ATM100

Atomic force microscope comes with combined design of scan head and sample stage so as to give strong anti-vibration performance. It’s equipped with precision laser detection and probe alignment device for simple & easy adjustment of laser beam.

FEATURES

  • Large range of sample transfer
  • Modular electronic system for easy maintenance
  • Adopted with spring for vibration isolation
  • Provides highly accurate results
  • Optical observation system for checking tip & sample’s position

SPECIFICATIONS

Operation modes Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
Scan angle Random angle
Maximum scan range X/Y axis: 20 µm, Z axis: 2 µm
Optical system/ Magnification of CCD Magnification: 4x, Resolution: 2.5 µm
Resolution X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample size Ø≤ 90 mm, H≤ 20 mm
Sample movement 0 to 20 mm
Pulse width of approaching motor 10 ± 2 ms
Scan rate 0.6 Hz to 4.34 Hz
Scanning control XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Types of sampling pixel 256×256, 512×512
Feedback type DSP digital feedback
Feedback sampling rate 64 KHz
PC connections: USB 2.0
Windows software Compatible with windows 98/2000/XP/7/8
Instrument Diemnsion 415 × 410 × 545 mm
Net weight 40 kg
Gross Weight 50 kg
APPLICATIONS

It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

SOFTWARE FEATURES

2 types of sampling pixel for selection (256×256, 512×512)
Selection of an area of interest for sampling by executing scan area move and cut function
Scans sample in random angle at beginning
Adjustment of laser spot detection system in real time
Selection and setting for different color scanning images in palette
Supports linear average and offset calibration in real time for sample title
Supports scanner sensitivity calibration and electronic controller auto-calibration
Supports offline analysis and process of sample image

Lab Expo Ltd.

Lab Expo Ltd.

CB03 , 4516 VALIANT DR NW, Calgary Alberta, T3A 0Y1, Canada

Email: info@labexpo.com | Website: www.labexpo.com | Phone: +1 403 879 9521

Catalog Generated On : 30/11/2021