Category Of Products

Atomic force microscope

Atomic force microscope 43-ATM100
  • Operation modes
  • Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
  • Scan angle
  • Random angle
  • Maximum scan range
  • X/Y axis: 20 µm, Z axis: 2 µm
  • Optical system/ Magnification of CCD
  • Magnification: 4x, Resolution: 2.5 µm
Atomic force microscope 43-ATM101
  • Operation modes
  • Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
  • Scan angle
  • 0 to 360°
  • Maximum scan range
  • X/Y axis: 50 µm, Z axis: 5 µm
  • Optical system/ Magnification of CCD
  • Magnification: 10x, Resolution: 1 µm

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